世界最高精度で曲面ミラーの形状を測る装置を開発 -EUV露光装置などに用いられる光学素子形状を、2ナノメートル精度で非接触測定-

2026-07-06 産業技術総合研究所

産業技術総合研究所(産総研)は、EUV露光装置や放射光施設などで用いられる高精度曲面ミラーの絶対形状を、非接触で世界最高水準となる2ナノメートル精度で測定できる新しい形状測定装置を開発した。従来の干渉計は基準面との比較測定であるため絶対形状の評価が難しく、曲面では測定範囲にも制約があった。本研究では、表面各点の局所角度分布を測定し、それを積分して形状を算出する走査型角度測定式形状測定装置(SDP)を曲面用に拡張した。さらに、自己校正型ロータリーエンコーダー(SelfA)を導入し、反射光が常に入射光と平行になるよう試料を回転させ、その回転角から局所角度を高精度に取得することで、広い角度範囲でも高精度測定を実現した。曲率半径5mの円筒面ミラーを測定した結果、繰り返し精度は標準偏差0.46nm、絶対形状測定の不確かさはPeak-to-Valley値で2.0nmを達成した。本技術は、EUV露光装置、放射光施設、天体望遠鏡、重力波検出器など先端光学システムの製造・評価技術の高度化に貢献すると期待される。

世界最高精度で曲面ミラーの形状を測る装置を開発 -EUV露光装置などに用いられる光学素子形状を、2ナノメートル精度で非接触測定-

<関連情報>

走査型偏向計を用いた曲面形状の非接触絶対測定 Non-contact absolute measurement of curved surface profiles using a scanning deflectometric profiler

Shusei Masuda, Yohan Kondo, Yasuaki Hori, Akiko Hirai, Youichi Bitou
Precision Engineering  Available online: 25 May 2026
DOI:https://doi.org/10.1016/j.precisioneng.2026.05.011

Highlights

  • Introduced a self-calibratable rotary encoder in a null configuration to a scanning deflectometric profiler (SDP).
  • Extended the measurable surface types of the SDP from flat surfaces to curved surfaces.
  • Measured a cylindrical surface with 5 m radius of curvature and 90 mm length with 4.0 nmexpanded uncertainty (k = 2).
  • Verified the absolute surface profile measurement accuracy within a few nanometers by comparison with a μ-CMM.

Abstract

Non-contact, absolute surface profile measurements—including a radius of curvature (RoC)—with a few nanometers uncertainty are essential for ultra-high-precision optical components. A scanning deflectometric profiler (SDP) based on an autocollimator measures local slope angle distributions to reconstruct surface profiles, achieving a few nanometers uncertainty for flat surfaces. However, for curved surfaces, measurement accuracy and dynamic range are fundamentally limited by the autocollimator. This study proposes a novel SDP for curved surfaces that utilizes a self-calibratable rotary encoder (SelfA) in a null configuration. During scanning, the surface under test (SUT) is rotated by a stage equipped with the SelfA, maintaining the reflected beam parallel to the incident beam. A rotation angle of the SelfA at the null condition corresponds to the local slope angle, enabling surface profile reconstruction from SelfA output at each measurement position. This approach allows high-accuracy local slope angle measurement and significantly extends the measurable range beyond the limitations of beam angle detection units, such as autocollimators. We measured spherical and cylindrical surfaces with RoCs of 4–5 m and measurement lengths of 90–180 mm. Repeatability better than 1.0 nm was achieved. For a cylindrical surface, the expanded uncertainty was evaluated to be 4.0 nm (k = 2). Comparison of absolute surface profiles obtained with the developed SDP and a micro-coordinate measuring machine showed agreement within a few nanometers. The proposed method enables non-contact, absolute profile measurements of optical components with meter-scale RoC, achieving a few nanometers measurement uncertainty.

0110情報・精密機器
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