ナノスケールの化学構造を「見える化」 -AFM-IR測定の空間分解能を高めるナノワイヤプローブを開発-

2026-05-08 産業技術総合研究所

National Institute of Advanced Industrial Science and TechnologyとHokkaido Universityの研究グループは、AFM-IR(原子間力顕微鏡赤外分光法)の空間分解能と検出感度を飛躍的に向上させる「ナノワイヤプローブ」を開発した。従来のAFM-IRでは、金属蒸着型プローブの先端径が約50 nmに制限され、ナノ構造の詳細解析が困難だった。研究では、銀ナノワイヤをAFM探針先端に固定化する独自構造を採用し、強い近接場光を発生させることで、10 nm以下、最大6 nm級という世界最高レベルの空間分解能を実現した。混合樹脂、酸化グラフェン、単一DNA分子の測定では、従来法を上回る高感度と微細構造識別能力を確認した。ナノ材料表面の官能基分布や単一生体分子解析も可能となり、機能性材料、半導体、高分子、生体分野でのナノスケール化学構造解析への応用が期待される。成果は『PNAS』に掲載された。

ナノスケールの化学構造を「見える化」 -AFM-IR測定の空間分解能を高めるナノワイヤプローブを開発-

<関連情報>

ナノワイヤベースのAFM-IR顕微鏡:銀ナノワイヤで機能化されたAFMプローブを用いて、10nm以下の解像度で化学構造を解明する Nanowire-based AFM-IR microscopy: Unveiling chemical structure at sub-10-nm resolution with silver nanowire–functionalized AFM probes

Yasuhiko Fujita, Mariko Takahashi, Farsai Taemaitree, +1 , and Hirohmi Watanabe
Proceedings of the National Academy Sciences  Published:April 30, 2026
DOI:https://doi.org/10.1073/pnas.2528122123

Significance

Despite advancements in near-field spectroscopies, achieving reliable nanoscale chemical analysis remains a significant challenge. Atomic force microscopy–based infrared (AFM-IR) microscopy has shown promise for nanoscale characterization; however, its resolution is limited by conventional metallic probes, which have a diameter of several tens of nanometers. To overcome this limitation, we have developed a nanowire-based AFM-IR microscopy. This approach uses chemically synthesized noble metal nanowires as resonant mid-infrared antenna, which enable the generation of highly confined near-fields. As a result, this technique significantly improves spatial resolution and detection sensitivity across a variety of samples. Our findings illustrate that nanowire-based AFM-IR is a powerful and broadly applicable platform for nanoscale IR spectroscopy, with potential implications for soft matter, two-dimensional materials, and biomolecular systems.

Abstract

Atomic force microscopy–based infrared (AFM-IR) microscopy has emerged as a powerful tool for nanoscale chemical imaging, combining the topographical precision of AFM with the molecular specificity of IR spectroscopy. However, its performance is still limited by conventional metal-coated AFM probes, which provide only modest near-field enhancement, ultimately restricting both spatial resolution and chemical sensitivity. In this work, we present a nanowire-based AFM-IR approach that overcomes these limitations by introducing a probe design: Chemically synthesized noble metal nanowires are affixed to the tip of a standard AFM cantilever. These nanowires support Fabry–Pérot resonances, functioning as mid-IR antennas that generate strongly confined optical near-field, thereby enhancing spatial resolution and sensitivity. The probe design also enables stable AFM-IR operation on both hard and soft materials. We demonstrate significantly improved imaging and spectroscopic performance, achieving spatial resolution below 10 nm and sensitivity at the submonolayer level. These findings establish nanowire-based AFM-IR microscopy as a highly promising platform for superresolution vibrational spectroscopy, with broad applications ranging from soft matter and two-dimensional materials to biomolecular analysis.

0110情報・精密機器
ad
ad
Follow
ad
タイトルとURLをコピーしました