ツイストロニクス材料を大面積化する製造技術を開発(Researchers Extend the Limits of Twistronics. Literally.)

2026-07-15 ノースカロライナ州立大学(NC State)

米国ノースカロライナ州立大学(NC State University)の研究チームは、二次元材料をわずかにねじって新しい電子特性を生み出す「ツイストロニクス」の適用範囲を広げる新たな理論手法を開発した。従来のツイストロニクスは、層同士を約1.1度の「魔法角」に近い小さな角度で重ねる必要があり、利用できる材料や構造が限られていた。今回の研究では、層間距離や原子配列などの構造条件も考慮することで、より広いねじれ角や多様な二次元材料でも同様の特殊な電子状態を実現できる可能性を示した。この成果により、超伝導や特殊な磁性などの量子現象を利用した新しい電子材料の設計が容易になると期待される。研究チームは、次世代の量子コンピュータや超低消費電力デバイス、スピントロニクスなどへの応用につながる重要な基盤技術になるとしている。

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大面積・高結晶性酸化物モアレ超格子の決定論的作製 Deterministic Fabrication of Large-Area, High-Crystallinity Oxide Moiré Superlattices

Reza Ghanbari,Eli Rodrigues,Young-Hoon Kim,Konnor Koons,Yan Li,Kabelo Lebogang,Yiming Ding,Douglas W. Barefoot,Yueyin Wang,Yin Liu,Hua Zhou,Miaofang Chi,and Ruijuan Xu
ACS Nano  Published: July 13, 2026
DOI:https://doi.org/10.1021/acsnano.6c04794

Abstract

ツイストロニクス材料を大面積化する製造技術を開発(Researchers Extend the Limits of Twistronics. Literally.)

Oxide twistronics extends moiré engineering beyond van der Waals materials, offering a promising platform for accessing emergent interfacial phenomena arising from the strong coupling of lattice, charge, and orbital degrees of freedom in complex oxides. However, deterministic fabrication of high-crystallinity oxide moiré superlattices over large lateral dimensions remains challenging due to the three-dimensional bonding network of oxides. Here, we demonstrate a scalable, generalized fabrication strategy that enables the formation of high-crystallinity oxide moiré superlattices with clean, chemically bonded interfaces and precisely controlled twist angles down to nominal values of 0.1°, achieving subdegree twist-angle accuracy across large contiguous lateral dimensions approaching the millimeter scale. Using NaNbO3 as a model system, we show that the resulting interlayer coupling drives pronounced structural reconstruction that modifies both the phase structure and ferroelectric domain configuration. Synchrotron-based X-ray 3D reciprocal space mapping reveals the emergence of a single-phase state in twisted bilayers, in contrast to the mixed-phase structure observed in single-layer membranes prior to twist assembly. The structural signatures are further consistent with gradual lattice rotation distributed along the thickness direction that may accommodate interfacial shear strain, distinct from reconstruction observed in van der Waals moiré systems which primarily occurs through in-plane stacking rearrangement. This collective lattice response is correlated with twist-dependent nanoscale electromechanical modulations observed by piezoresponse force microscopy. These results establish a scalable materials platform for oxide twistronics and support the implementation of twist-engineered functionalities in practical, macroscale device architectures.

1700応用理学一般
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