2025-06-14 科学技術振興機構,東京大学
（a）HH界面の模式図。分極Pの向きが界面に対して向かい合っており、界面には正の分極電荷が形成されると考えられる。
（b）TT界面の模式図。分極Pの向きが界面に対して背中合わせとなっており、界面には負の分極電荷が形成されると考えられる。
＜関連情報＞
- https://www.jst.go.jp/pr/announce/20250614/index.html
- https://www.jst.go.jp/pr/announce/20250614/pdf/20250614.pdf
- https://www.science.org/doi/10.1126/sciadv.adu8021
ナノスケール強誘電体界面における分極誘起電荷の実空間観察 Real-space observation of polarization induced charges at nanoscale ferroelectric interfaces
Masaya Takamoto, Satoko Toyama, Takehito Seki, Toshihiro Futazuka , […] , and Naoya Shibata
Science Advances Published:13 Jun 2025
DOI:https://doi.org/10.1126/sciadv.adu8021
Abstract
Unique electrical properties emerging at nanoscale ferroelectric interfaces originate from the polarization induced charges. However, real-space characterization of polarization induced charges at nanoscale ferroelectric interfaces has been extremely challenging. Here, directly observing the nanoscale electric field by tilt-scan averaged differential phase contrast scanning transmission electron microscopy enables us to measure the spatially varying total charge density profiles across both head-to-head and tail-to-tail domain walls in a ferroelectric crystal. Combined with atomic column displacement measurements, the spatial distribution of polarization bound charges and screening charges across the domain walls can be disentangled. Our results reveal the true charge states of the nanoscale ferroelectric interfaces, providing an opportunity for experimentally exploring the interplay between atomic-scale local polarization structures and their charge states in ferroelectric interfaces.
