2025-03-27 東京大学,東北大学
＜関連情報＞
- https://www.issp.u-tokyo.ac.jp/maincontents/news2.html?pid=26645
- https://www.issp.u-tokyo.ac.jp/news/wp-content/uploads/2025/03/0327_press_SX-PES.pdf
- https://iopscience.iop.org/article/10.35848/1882-0786/adbda8
実環境圧力下における軟X線光電子分光 Soft X-ray photoelectron spectroscopy under real ambient pressure conditions
Tetsuya Wada, Masafumi Horio, Yifu Liu, Yu Murano, Haruto Sakurai, Toshihide Sumi, Masashige Miyamoto, Susumu Yamamoto and Iwao Matsuda
Applied Physics Express Published: 26 March 2025
DOI:10.35848/1882-0786/adbda8
Abstract
We have developed a measurement system for soft X-ray ambient pressure photoelectron spectroscopy at BL08U of NanoTerasu. An excitation light of 800 eV was introduced by a vacuum tube terminated with a SiN window. Photoelectrons were detected through a ϕ24 μm aperture at the electron lens entrance of a differentially pumped analyzer. The Au 4f core-level spectra of a Au film were measured up to atmospheric pressure (1 bar) with He, to 1 bar with H2, and to 0.4 bar with N2. The system extends applications of operando experiments for the real functional materials.
