フレキシブルエレクトロニクスの新しい転写印刷法(New Method for Transfer Printing of Flexible Electronics)

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2024-06-25 韓国基礎科学研究院(IBS)

韓国の基礎科学研究所(IBS)の研究者たちは、柔軟な電子デバイスのための革新的なドライ転写印刷技術を開発しました。この方法は、高品質の電子材料を損傷なく転写できるもので、電子材料が高温で合成・処理される必要がある従来の方法に対し、大きな進歩となります。従来の転写技術は有害な化学物質の使用や機械的損傷のリスクがありましたが、IBSの新しい方法は薄膜内の応力を制御することで損傷を防ぎます。この技術は、大面積およびマイクロスケールのパターンにも対応でき、様々な分野での応用が期待されます。

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高性能フレキシブル2次元・3次元エレクトロニクスのための応力工学を用いたダメージフリー・ドライ・トランスファー法 Damage-free dry transfer method using stress engineering for high-performance flexible two- and three-dimensional electronics

Yoonsoo Shin,Seungki Hong,Yong Chan Hur,Chanhyuk Lim,Kyungsik Do,Ji Hoon Kim,Dae-Hyeong Kim & Sangkyu Lee
Nature Materials  Published:21 June 2024
DOI:https://doi.org/10.1038/s41563-024-01931-y

フレキシブルエレクトロニクスの新しい転写印刷法(New Method for Transfer Printing of Flexible Electronics)

Abstract

Advanced transfer printing technologies have enabled the fabrication of high-performance flexible and stretchable devices, revolutionizing many research fields including soft electronics, optoelectronics, bioelectronics and energy devices. Despite previous innovations, challenges remain, such as safety concerns due to toxic chemicals, the expensive equipment, film damage during the transfer process and difficulty in high-temperature processing. Thus a new transfer printing process is needed for the commercialization of high-performance soft electronic devices. Here we propose a damage-free dry transfer printing strategy based on stress control of the deposited thin films. First, stress-controlled metal bilayer films are deposited using direct current magnetron sputtering. Subsequently, mechanical bending is applied to facilitate the release of the metal bilayer by increasing the overall stress. Experimental and simulation studies elucidate the stress evolution mechanisms during the processes. By using this method, we successfully transfer metal thin films and high-temperature-treated oxide thin films onto flexible or stretchable substrates, enabling the fabrication of two-dimensional flexible electronic devices and three-dimensional multifunctional devices.

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