0.2 Vの超低電圧でデータを保持できる新しいCMOSメモリ技術を開発~不揮発メモリを使わずに待機時電力を大幅に削減~

2025-10-31 東京科学大学

東京科学大学(Science Tokyo)の菅原聡准教授らは、わずか0.2Vという超低電圧でもデータ保持が可能な新型CMOSメモリ技術「ULVR-SRAM」を開発した。リーク電流を活用した新しい擬似nMOSインバータを設計し、双安定構造をもつ8T⁽ᵁ⁾セルを構成。0.16Vでも安定動作を維持し、従来比93%の待機電力削減を実現した。設計ばらつきを考慮しても6σのノイズ耐性を確保し、不揮発メモリ並みの省電力性能を揮発型SRAMで達成した点が特徴である。成果はIEEE Open Journal of Circuits and Systems誌に掲載。

0.2 Vの超低電圧でデータを保持できる新しいCMOSメモリ技術を開発~不揮発メモリを使わずに待機時電力を大幅に削減~
図1. (a)ST0、(b)ST1、(c) nST1インバータの回路構成

<関連情報>

ノイズ耐性を強化する新型超低電圧リテンションSRAMセル A New Ultralow-Voltage Retention SRAM Cell Enhancing Noise Immunity

Katsutoshi Ito; Yusaku Shiotsu; Satoshi Sugahara
IEEE Open Journal of Circuits and Systems  Published:31 July 2025
DOI:https://doi.org/10.1109/OJCAS.2025.3594022

Abstract:

A new ultralow-voltage retention (ULVR) SRAM cell is proposed, which can highly enhance the noise margin (NM) for the ULVR mode at ultralow voltages (VUL) . This 8T cell is configured with new-type Schmitt-trigger (ST) inverters that can nearly maximize the hysteresis width of the voltage transfer characteristics (VTC). The design methodology of the cell is developed with careful consideration for the process variation of the constituent transistors, and the optimally designed cell can ensure sufficient NMs that satisfy the 6σ failure probability for all the operating modes. In particular, for the ULVR mode at VUL=0.2 V, the proposed 8T cell can exhibit much stronger noise immunity than previously proposed various low-voltage cells. In addition, the proposed 8T cell can achieve stable data retention even at VUL=0.16 V with sufficient noise immunity satisfying the 6σ failure probability. An 8kB ULVR-SRAM macro configured with the proposed-8T-cell array is also developed. Using the ULVR mode, the macro can reduce the standby power by ~93% compared with the standby mode of a conventional 6T-SRAM macro.

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