干渉リソグラフィで新たな進展(Li Xinghui’s group makes new progress in interference lithography)

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2025-03-23 清華大学

清華大学深圳国際大学院の李興輝研究グループは、干渉リソグラフィにおける新たな露光ステッチング手法を開発しました。参照格子を用いたグローバルアライメントにより、x・y方向のアライメント誤差をリアルタイム補正し、露光領域の連続性を高精度に維持。3×3格子アレイでの実験では、補正によりPV値0.125λ、RMS値0.023λと高精度を実現し、不補正では精度が大きく劣化。大面積回折格子製造への応用が期待されます。

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レーザー干渉リソグラフィパターンアレイのグローバルアライメント基準戦略 Global alignment reference strategy for laser interference lithography pattern arrays

Xiang Gao,Jingwen Li,Zijian Zhong & Xinghui Li
Microsystems & Nanoengineering  Published:04 March 2025
DOI:https://doi.org/10.1038/s41378-025-00889-4

干渉リソグラフィで新たな進展(Li Xinghui’s group makes new progress in interference lithography)

Abstract

Large-area gratings play a crucial role in various engineering fields. However, traditional interference lithography is limited by the size of optical component apertures, making large-area fabrication a challenging task. Here, a method for fabricating laser interference lithography pattern arrays with a global alignment reference strategy is proposed. This approach enables alignment of each area of the laser interference lithography pattern arrays, including phase, period, and tilt angle. Two reference gratings are utilized: one is detached from the substrate, while the other remains fixed to it. To achieve global alignment, the exposure area is adjusted by alternating between moving the beam and the substrate. In our experiment, a 3 × 3 regions grating array was fabricated, and the −1st-order diffraction wavefront measured by the Fizeau interferometer exhibited good continuity. This technique enables effective and efficient alignment with high accuracy across any region in an interference lithography pattern array on large substrates. It can also serve as a common technique for fabricating various types of periodic structures by rotating the substrate.

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