2025-02-28 ニューヨーク大学（NYU）
Photo credit: OsakaWayne Studios/Getty Images.
＜関連情報＞
- https://www.nyu.edu/about/news-publications/news/2025/february/scientists-use-ai-to-better-understand-nanoparticles.html
- https://www.science.org/doi/10.1126/science.ads2688
深層ノイズ除去によるナノ粒子表面のダイナミクスと不安定性の可視化 Visualizing nanoparticle surface dynamics and instabilities enabled by deep denoising
Peter A. Crozier, Matan Leibovich, Piyush Haluai, Mai Tan, […], and Carlos Fernandez-Granda
Science Published:27 Feb 2025
Editor’s summary
Continuous transitions of the surfaces of metal nanoparticles in a gas environment have been revealed with transmission electron microscopy. Crozier et al. used unsupervised deep denoising to overcome the poor signal-to-noise ratios inherent in imaging with both high spatial and millisecond time resolution. Stress fields that penetrated below the surface of platinum nanoparticles supported on cerium oxide destabilized the nanoparticles and led to a series of transitions between ordered and disordered configurations. —Phil Szuromi
Abstract
Materials functionalities may be associated with atomic-level structural dynamics occurring on the millisecond timescale. However, the capability of electron microscopy to image structures with high spatial resolution and millisecond temporal resolution is often limited by poor signal-to-noise ratios. With an unsupervised deep denoising framework, we observed metal nanoparticle surfaces (platinum nanoparticles on cerium oxide) in a gas environment with time resolutions down to 10 milliseconds at a moderate electron dose. On this timescale, many nanoparticle surfaces continuously transition between ordered and disordered configurations. Stress fields can penetrate below the surface, leading to defect formation and destabilization, thus making the nanoparticle fluxional. Combining this unsupervised denoiser with in situ electron microscopy greatly improves spatiotemporal characterization, opening a new window for the exploration of atomic-level structural dynamics in materials.
